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 PD -94912
IRG4PC40KDPBF
INSULATED GATE BIPOLAR TRANSISTOR WITH ULTRAFAST SOFT RECOVERY DIODE
Features
Short Circuit Rated UltraFast: Optimized for high operating frequencies >5.0 kHz , and Short Circuit Rated to 10s @ 125C, VGE = 15V Generation 4 IGBT design provides tighter parameter distribution and higher efficiency than Generation 3 IGBT co-packaged with HEXFREDTM ultrafast, ultra-soft-recovery anti-parallel diodes for use in bridge configurations Industry standard TO-247AC package Lead-Free
C
Short Circuit Rated UltraFast IGBT
VCES = 600V
G E
VCE(on) typ. = 2.1V
@VGE = 15V, IC = 25A
n-channel
Benefits
Generation 4 IGBTs offer highest efficiencies available HEXFRED diodes optimized for performance with IGBTs. Minimized recovery characteristics require less/no snubbing Designed to be a "drop-in" replacement for equivalent industry-standard Generation 3 IR IGBTs
TO-247AC
Absolute Maximum Ratings
Parameter
VCES IC @ TC = 25C IC @ TC = 100C ICM ILM IF @ TC = 100C IFM tsc VGE PD @ TC = 25C PD @ TC = 100C TJ TSTG Collector-to-Emitter Voltage Continuous Collector Current Continuous Collector Current Pulsed Collector Current Clamped Inductive Load Current Diode Continuous Forward Current Diode Maximum Forward Current Short Circuit Withstand Time Gate-to-Emitter Voltage Maximum Power Dissipation Maximum Power Dissipation Operating Junction and Storage Temperature Range Soldering Temperature, for 10 sec. Mounting Torque, 6-32 or M3 Screw.
Max.
600 42 25 84 84 15 84 10 20 160 65 -55 to +150 300 (0.063 in. (1.6mm) from case) 10 lbfin (1.1 Nm)
Units
V
A
s V W C
Thermal Resistance
Parameter
RJC RJC RCS RJA Wt Junction-to-Case - IGBT Junction-to-Case - Diode Case-to-Sink, flat, greased surface Junction-to-Ambient, typical socket mount Weight
Min.

Typ.
0.24 6 (0.21)
Max.
0.77 1.7 40
Units
C/W
g (oz)
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1
12/29/03
IRG4PC40KDPBF
Electrical Characteristics @ TJ = 25C (unless otherwise specified)
V(BR)CES
V(BR)CES/TJ
VCE(on)
VGE(th) VGE(th)/TJ gfe ICES VFM IGES
Parameter Min. Typ. Max. Units Collector-to-Emitter Breakdown Voltage 600 V Temperature Coeff. of Breakdown Voltage 0.46 V/C Collector-to-Emitter Saturation Voltage 2.10 2.6 2.70 V 2.14 Gate Threshold Voltage 3.0 6.0 Temperature Coeff. of Threshold Voltage -13 mV/C Forward Transconductance 7.0 14 S Zero Gate Voltage Collector Current 250 A 3500 Diode Forward Voltage Drop 1.3 1.7 V 1.2 1.6 Gate-to-Emitter Leakage Current 100 nA
Conditions VGE = 0V, IC = 250A VGE = 0V, IC = 1.0mA IC = 25A VGE = 15V See Fig. 2, 5 IC = 42A IC = 25A, TJ = 150C VCE = VGE, IC = 250A VCE = VGE, IC = 250A VCE = 100V, IC = 25A VGE = 0V, VCE = 600V VGE = 0V, VCE = 600V, TJ = 150C IC = 15A See Fig. 13 IC = 15A, TJ = 150C VGE = 20V
Switching Characteristics @ TJ = 25C (unless otherwise specified)
Qg Qge Qgc t d(on) tr td(off) tf Eon Eoff Ets tsc t d(on) tr t d(off) tf Ets LE Cies Coes Cres trr Irr Qrr di(rec)M/dt Parameter Total Gate Charge (turn-on) Gate - Emitter Charge (turn-on) Gate - Collector Charge (turn-on) Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Turn-On Switching Loss Turn-Off Switching Loss Total Switching Loss Short Circuit Withstand Time Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Total Switching Loss Internal Emitter Inductance Input Capacitance Output Capacitance Reverse Transfer Capacitance Diode Reverse Recovery Time Diode Peak Reverse Recovery Current Diode Reverse Recovery Charge Diode Peak Rate of Fall of Recovery During tb Min. 10 Typ. Max. Units Conditions 120 180 IC = 25A 16 24 nC VCC = 400V See Fig.8 51 77 VGE = 15V 53 33 TJ = 25C ns 110 160 IC = 25A, VCC = 480V 100 150 VGE = 15V, RG = 10 0.95 Energy losses include "tail" 0.76 mJ See Fig. 9,10,14 1.71 2.3 s VCC = 360V, TJ = 125C VGE = 15V, RG = 10 , VCPK < 500V 52 TJ = 150C, 37 IC = 25A, VCC = 480V ns 220 VGE = 15V, RG = 10 140 Energy losses include "tail" 2.67 mJ See Fig. 11,14 13 nH Measured 5mm from package 1600 VGE = 0V 130 pF VCC = 30V See Fig. 7 55 = 1.0MHz 42 60 ns TJ = 25C See Fig. 74 120 TJ = 125C 14 IF = 15A 4.0 6.0 A TJ = 25C See Fig. 6.5 10 TJ = 125C 15 VR = 200V 80 180 nC TJ = 25C See Fig. 220 600 TJ = 125C 16 di/dt = 200As 188 A/s TJ = 25C See Fig. 160 TJ = 125C 17
2
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IRG4PC40KDPBF
30
For both:
25
LOAD CURRENT (A)
20
Square wave:
Duty cycle: 50% TJ = 125C Tsink = 90C Gate drive as specified
Power Dissipation = 35 W
15
60% of rated voltage
I
10
5
Ideal diodes
0 0.1
1
10
100
f, Frequency (KHz)
Fig. 1 - Typical Load Current vs. Frequency
(Load Current = IRMS of fundamental)
100
100
I C , Collector-to-Emitter Current (A)
IC , Collector-to-Emitter Current (A)
TJ = 150C TJ = 25C
TJ = 150 o C
10
10
TJ = 25 oC
1 0.1
V GE = 15V 20s PULSE WIDTH
1 10
1 5 7
V CC = 50V 5s PULSE WIDTH A
9 11
VCE , Collector-to-Emitter Voltage (V)
VGE, Gate-to-Emitter Voltage (V)
Fig. 2 - Typical Output Characteristics
Fig. 3 - Typical Transfer Characteristics
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3
IRG4PC40KDPBF
50
5.0
VCE , Collector-to-Emitter Voltage(V)
VGE = 15V 80 us PULSE WIDTH
Maximum DC Collector Current(A)
40
IC = 50 A
4.0
30
3.0
20
IC = 25 A
2.0
10
IC =12.5 A
0
25
50
75
100
125
150
TC , Case Temperature ( C)
1.0 -60 -40 -20
0
20
40
60
80 100 120 140 160
TJ , Junction Temperature ( C)
Fig. 4 - Maximum Collector Current vs. Case Temperature
Fig. 5 - Typical Collector-to-Emitter Voltage vs. Junction Temperature
1
Thermal Response (Z thJC )
D = 0.50
0.20 0.1 0.10 0.05 0.02 0.01 PDM t1 SINGLE PULSE (THERMAL RESPONSE) t2 Notes: 1. Duty factor D = t 1 / t 2 2. Peak TJ = PDM x Z thJC + TC 0.001 0.01 0.1 1
0.01 0.00001
0.0001
t1 , Rectangular Pulse Duration (sec)
Fig. 6 - Maximum Effective Transient Thermal Impedance, Junction-to-Case
4
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IRG4PC40KDPBF
3000 2500
VGE , Gate-to-Emitter Voltage (V)
100
VGE = 0V, f = 1MHz Cies = Cge + Cgc , Cce SHORTED Cres = Cgc Coes = Cce + Cgc
20
VCC = 400V I C = 25A
16
C, Capacitance (pF)
2000
Cies
1500
12
8
1000
500
4
0
Coes Cres
1 10
0
VCE , Collector-to-Emitter Voltage (V)
0
20
40
60
80
100
120
140
QG , Total Gate Charge (nC)
Fig. 7 - Typical Capacitance vs. Collector-to-Emitter Voltage
Fig. 8 - Typical Gate Charge vs. Gate-to-Emitter Voltage
3.00
Total Switching Losses (mJ)
Total Switching Losses (mJ)
V CC = 480V V GE = 15V TJ = 25 C I C = 25A
100
RG = 10 Ohm VGE = 15V VCC = 480V
2.50
10
IC = 50 A IC = 25 A
2.00
1
IC = 12.5 A
1.50
0
R Gate Resistance ) RGG, Gate Resistance ((Ohm)
10
20
30
40
50
0.1 -60 -40 -20
0
20
40
60
80 100 120 140 160
TJ , Junction Temperature ( C )
Fig. 9 - Typical Switching Losses vs. Gate Resistance
Fig. 10 - Typical Switching Losses vs. Junction Temperature
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5
IRG4PC40KDPBF
8.0 6.0
I C , Collector-to-Emitter Current (A)
Total Switching Losses (mJ)
RG = Ohm 10 T J = 150 C VCC = 480V VGE = 15V
1000
VGE = 20V T J = 125 o C 125C
100
4.0
10
2.0
0.0
0
10
20
30
40
50
1
SAFE OPERATING AREA
1 10 100 1000
I C , Collector-to-emitter Current (A)
VCE , Collector-to-Emitter Voltage (V)
Fig. 11 - Typical Switching Losses vs. Collector-to-Emitter Current
100
Fig. 12 - Turn-Off SOA
Instantaneous Forward Current - I F (A)
10
TJ = 150C TJ = 125C TJ = 25C
1 0.8
1.2
1.6
2.0
2.4
Forward Voltage Drop - V FM (V)
Fig. 13 - Maximum Forward Voltage Drop vs. Instantaneous Forward Current
6
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100
100
IRG4PC40KDPBF
VR = 200V TJ = 125C TJ = 25C
VR = 200V TJ = 125C TJ = 25C
80
I F = 30A
I F = 30A
60
I IRRM - (A)
t rr - (ns)
10
IF = 15A
I F = 15A
40
I F = 5.0A
I F = 5.0A
20 100
di f /dt - (A/s)
1000
1 100
di f /dt - (A/s)
1000
Fig. 14 - Typical Reverse Recovery vs. dif/dt
800
Fig. 15 - Typical Recovery Current vs. dif/dt
1000
VR = 200V TJ = 125C TJ = 25C
600
VR = 200V TJ = 125C TJ = 25C
IF = 30A
di(rec)M/dt - (A/s)
Q RR - (nC)
400
I F = 5.0A I F = 15A I F = 30A
I F = 15A IF = 5.0A
200
0 100
di f /dt - (A/s)
1000
100 100
di f /dt - (A/s)
1000
Fig. 16 - Typical Stored Charge vs. dif/dt
Fig. 17 - Typical di(rec)M/dt vs. dif/dt
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7
IRG4PC40KDPBF
Same type device as D.U.T.
90% Vge +Vge
Vce
80% of Vce
430F D.U.T.
Ic 10% Vce 90% Ic Ic 5% Ic td(off) tf
Fig. 18a - Test Circuit for Measurement of ILM, Eon, Eoff(diode), trr, Qrr, Irr, td(on), tr, td(off), tf
Eoff =
t1+5S Vce Ic Vceic dtdt
t1
t1
t2
Fig. 18b - Test Waveforms for Circuit of Fig. 18a, Defining
Eoff, td(off), tf
GATE VOLTAGE D.U.T. 10% +Vg +Vg
Ic
trr
Qrr =
trr id dt Ic dt tx
tx 10% Vcc Vce Vcc 10% Ic 90% Ic DUT VOLTAGE AND CURRENT Ipk
10% Irr Vcc
Vpk
Irr
Ic DIODE RECOVERY WAVEFORMS
td(on)
tr
5% Vce t2 Vce Ic Eon = Vce ie dtdt t1 t2 DIODE REVERSE RECOVERY ENERGY t3
t4 Erec = Vd idIc dt Vd dt t3
t1
t4
Fig. 18c - Test Waveforms for Circuit of Fig. 18a,
Defining Eon, td(on), tr
Fig. 18d - Test Waveforms for Circuit of Fig. 18a,
Defining Erec, trr, Qrr, Irr
8
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IRG4PC40KDPBF
Vg GATE SIGNAL DEVICE UNDER TEST CURRENT D.U.T.
VOLTAGE IN D.U.T.
CURRENT IN D1
t0
t1
t2
Figure 18e. Macro Waveforms for Figure 18a's Test Circuit
L 1000V 50V 6000F 100V Vc*
D.U.T.
RL= 0 - 480V
480V 4 X IC @25C
Figure 19. Clamped Inductive Load Test Circuit
Figure 20. Pulsed Collector Current Test Circuit
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9
IRG4PC40KDPBF
Notes:
Repetitive rating: VGE=20V; pulse width limited by maximum junction temperature (figure 20) VCC=80%(VCES), VGE=20V, L=10H, RG= 10 (figure 19) Pulse width 80s; duty factor 0.1%. Pulse width 5.0s, single shot.
TO-247AC Package Outline
15.90 (.626) 15.30 (.602) -B3.65 (.143) 3.55 (.140) -A-
Dimensions are shown in millimeters (inches)
-D5.30 (.209) 4.70 (.185)
0.25 (.010) M D B M 5.50 (.217)
2.50 (.089) 1.50 (.059) 4
20.30 (.800) 19.70 (.775) 1 2 3
2X
5.50 (.217) 4.50 (.177)
NOTES: 1 DIMENSIONING & TOLERANCING PER ANSI Y14.5M, 1982. 2 CONTROLLING DIMENSION : INCH. 3 CONFORMS TO JEDEC OUTLINE TO-247-AC.
-C14.80 (.583) 14.20 (.559) 4.30 (.170) 3.70 (.145)
2.40 (.094) 2.00 (.079) 2X 5.45 (.215) 2X
1.40 (.056) 3X 1.00 (.039) 0.25 (.010) M 3.40 (.133) 3.00 (.118) C AS
0.80 (.031) 3X 0.40 (.016) 2.60 (.102) 2.20 (.087)
LEAD ASSIGNMENTS Hexfet IGBT 1 -LEAD ASSIGNMENTS Gate 1 - Gate 1 - GATE2 - Collector 2 - Drain 2 - DRAIN 3 - Source 3 - Emitter 3 - SOURCE 4 - Drain DRAIN - Collector 4 4-
TO-247AC Part Marking Information
EXAMPLE: T HIS IS AN IRFPE30 WIT H ASSEMBLY LOT CODE 5657 ASSEMBLED ON WW 35, 2000 IN THE AS SEMBLY LINE "H"
Note: "P" in assembly line position indicates "Lead-Free"
INT ERNATIONAL RECT IFIER LOGO ASSEMBLY LOT CODE
PART NUMBER
IRFPE30
56 035H 57
DAT E CODE YEAR 0 = 2000 WEEK 35 LINE H
Data and specifications subject to change without notice.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105 TAC Fax: (310) 252-7903 Visit us at www.irf.com for sales contact information.12/03
10
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Note: For the most current drawings please refer to the IR website at: http://www.irf.com/package/


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